Session 6B

3:30pm - 5:30pm

Delay Test Issues

Co-Chairs

Sreejit Chakravarty, Intel
Jayashree Saxena, TI

3:30pm

Introduction

3:35pm

6B-1    Delay Fault Diagnosis Using Real Timing Information
Zhiyuan Wang Malgorzata Marek-Sadowska Kun-Han Tsai Janusz Rajski

4:05pm

6B-2    An Adaptive Path Delay Fault Diagnosis Methodology
Saravanan Padmanaban, Spyros Tragoudas

  4:35pm

6B-3    Scan BIST Targeting Transition Faults Using a Markov Source
Hangkyu Lee, Irith Pomeranz, Sudhakar Reddy

5:05pm

6B-4    The effect of threshold voltages on the soft error rate
V. Degalahal, N. Rajaraman, N. Vijaykrishnan, Y. Xie, M. J. Irwin